Reliability simulation and circuit-failure analysis in analog and mixed-signal applications

Keyphrases

• Analog Signal 100%
• Failure Rate 100%
• Circuit Failure 100%
• Simulation Failures 100%
• Reliability Simulation 100%
• Failure Analysis 100%
• Negative Bias Temperature Instability 100%
• Mixed-signal Applications 100%
• Operating Conditions 66%
• Failure Mechanism 66%
• Device Level 66%
• Circuit Level 66%
• Converter Circuit 66%
• Elevated Temperature 33%
• Rate of Increase 33%
• Output Voltage 33%
• Lifetime Estimation 33%
• Multiple Failure Mechanisms 33%
• Reliability Failure 33%
• Operating Voltage 33%
• Complete Analysis 33%
• Design Reliability 33%
• Operating Temperature 33%
• Product Level 33%
• Failure Behavior 33%
• Circuit Performance 33%
• Reliability Methodology 33%
• Signal Failures 33%
• Reliable Design 33%
• Mixed-signal 33%
• Analog-to-digital Converter 33%
• Voltage Delay 33%
• Voltage Degradation 33%
• Time-dependent Reliability 33%
• Flash Analog-to-digital Converter 33%
• Reliability Behavior 33%
• Application Rate 33%
• Circuit Life 33%
• Advanced CMOS 33%

Engineering

• Failure Rate 100%
• Failure Mechanism 100%
• Failure Analysis 100%
• Negative-Bias Temperature Instability 100%
• Analog-to-Digital Converter 66%
• Simulation Result 33%
• Output Voltage 33%
• Elevated Temperature 33%
• Operating Voltage 33%
• Rate Increase 33%
• Operating Temperature 33%
• Field Data 33%
• Design for Reliability 33%
• Failure Behavior 33%
• Circuit Performance 33%
• Application Rate 33%