@inproceedings{7d2ec584421348c9b5639b1e8ca07ad3,
title = "Prediction of earpiece field failure rate based on accelerated life tests",
abstract = "We delineate an approach for predicting the audio components failure rate during field use, based on advanced accelerated life tests. The methodology provides a structural and well-organized process for focusing on the physics of failure of the part, selecting the proper stresses for acceleration and utilizing field data for final validation. We show a test case in which accuracy of more than 95\% was achieved.",
keywords = "Failure Rate, Physics of Failure, Reliability, Weibull",
author = "Avshalom Hava and Felix Barmoav and Eli Ribak and Carey Moulton and Bob Kowalski and Bernstein, \{Joseph B.\}",
year = "2012",
doi = "10.1109/EEEI.2012.6377091",
language = "אנגלית",
isbn = "9781467346801",
series = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012",
booktitle = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012",
note = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 ; Conference date: 14-11-2012 Through 17-11-2012",
}