Penetration depth measurement in high quality YBa₂Cu₃O_{7 - X} thin films

The parallel plate resonator method has been used for measuring high quality YBa₂Cu₃O_{7 - x} (YBCO) thin films, which have low temperature residual losses comparable to those previously obtained in single crystals. The surface resistance and the real part of the conductivity show a non-monotonic behaviour with a broad peak around 45 K. The penetration depth and the real part of the conductivity vary linearly at low temperatures. The lowest penetration depth linear fitting has a slope value of 2.2 Å/K to 2.5 Å/K up to 20 K which is lower than previous measurements on YBCO single crystals. An interpretation of this smaller slope in terms of the generally accepted d-wave order parameter symmetry presents difficulties.