TY - GEN
T1 - Open-loop, self-excitation in a bistable micromechanical beam actuated by a DC electrostatic load
AU - Medina, Lior
AU - Gilat, Rivka
AU - Ilic, Bojan R.
AU - Krylov, Slava
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/2/23
Y1 - 2017/2/23
N2 - We demonstrate an open-loop self-excitation response in a curved, bistable microelectromechanical beam under a time-independent electrostatic load. The self-excitation is triggered by placing a high value resistor in series with a beam that is on the verge of bistability. The voltage-deflection curve of such a beam contains an inflection point, where the slope of the curve is approximately zero. Our results show that actuation at a voltage corresponding to the inflection point induces stable self-sustained oscillations. We further observe that implementation of the same actuation scenario in a bistable beam, with the voltage-deflection curve containing two stable branches, does not lead to self-excitation.
AB - We demonstrate an open-loop self-excitation response in a curved, bistable microelectromechanical beam under a time-independent electrostatic load. The self-excitation is triggered by placing a high value resistor in series with a beam that is on the verge of bistability. The voltage-deflection curve of such a beam contains an inflection point, where the slope of the curve is approximately zero. Our results show that actuation at a voltage corresponding to the inflection point induces stable self-sustained oscillations. We further observe that implementation of the same actuation scenario in a bistable beam, with the voltage-deflection curve containing two stable branches, does not lead to self-excitation.
KW - Bistability
KW - Curved micromechanical beam
KW - Electrostatic actuation
KW - MEMS/NEMS
KW - Self-excitation
UR - http://www.scopus.com/inward/record.url?scp=85015729679&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2017.7863525
DO - 10.1109/MEMSYS.2017.7863525
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AN - SCOPUS:85015729679
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 785
EP - 788
BT - 2017 IEEE 30th International Conference on Micro Electro Mechanical Systems, MEMS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 30th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2017
Y2 - 22 January 2017 through 26 January 2017
ER -