New technique to extract TDDB acceleration parameters from fast Qbd tests

Yuan Chen; John S. Suehle; Bruce Shen; Joseph Bernstein; Cleston Messick; Prasad Chaparala

New technique to extract TDDB acceleration parameters from fast Q_bd tests

Yuan Chen, John S. Suehle, Bruce Shen, Joseph Bernstein, Cleston Messick, Prasad Chaparala

פרסום מחקרי: תוצר מחקר מכנס › הרצאה › ביקורת עמיתים

תקציר

A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

שפה מקורית	אנגלית
עמודים	67-69
מספר עמודים	3
סטטוס פרסום	פורסם - 1997
פורסם באופן חיצוני	כן
אירוע	Proceedings of the 1997 IEEE International Integrated Reliability Workshop - Tahoe, CA, USA משך הזמן: 13 אוק׳ 1997 → 16 אוק׳ 1997

כנס

כנס	Proceedings of the 1997 IEEE International Integrated Reliability Workshop
עיר	Tahoe, CA, USA
תקופה	13/10/97 → 16/10/97

קבצים וקישורים אחרים

Link to publication in Scopus

פורמט ציטוט ביבליוגרפי

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title = "New technique to extract TDDB acceleration parameters from fast Qbd tests",

abstract = "A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.",

author = "Yuan Chen and Suehle, {John S.} and Bruce Shen and Joseph Bernstein and Cleston Messick and Prasad Chaparala",

year = "1997",

language = "אנגלית",

pages = "67--69",

note = "Proceedings of the 1997 IEEE International Integrated Reliability Workshop ; Conference date: 13-10-1997 Through 16-10-1997",

}

TY - CONF

T1 - New technique to extract TDDB acceleration parameters from fast Qbd tests

AU - Chen, Yuan

AU - Suehle, John S.

AU - Shen, Bruce

AU - Bernstein, Joseph

AU - Messick, Cleston

AU - Chaparala, Prasad

PY - 1997

Y1 - 1997

N2 - A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

AB - A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

UR - http://www.scopus.com/inward/record.url?scp=0031370126&partnerID=8YFLogxK

M3 - ???researchoutput.researchoutputtypes.contributiontoconference.paper???

AN - SCOPUS:0031370126

SP - 67

EP - 69

T2 - Proceedings of the 1997 IEEE International Integrated Reliability Workshop

Y2 - 13 October 1997 through 16 October 1997

ER -

New technique to extract TDDB acceleration parameters from fast Qbd tests

תקציר

כנס

קבצים וקישורים אחרים

טביעת אצבע

פורמט ציטוט ביבליוגרפי

New technique to extract TDDB acceleration parameters from fast Q_bd tests