תקציר
Solid metallic connections have been successfully formed between two standard levels of metallization using a focussed IR laser system. This new process of laser farmed connections has been used to link chins with resistances of less than 0.8 Ω per connection. Commercial laser repair systems used extensively by the memory industry were employed to perform over 100,000 individual links over a wide set of laser parameters without failure. This technology has the potential to replace laser fuse cutting techniques to program wiring in silicon-on-silicon, wafer scale integration (WSI), and system-on-a-chip applications. Furthermore, because it is an additive process and the passivation remains completely in tact, it lends itself to redundancy with perfect yield and exceptional reliability.
| שפה מקורית | אנגלית |
|---|---|
| עמודים (מ-עד) | 163-165 |
| מספר עמודים | 3 |
| כתב עת | Proceedings of the Custom Integrated Circuits Conference |
| סטטוס פרסום | פורסם - 1998 |
| פורסם באופן חיצוני | כן |
| אירוע | Proceedings of the 1998 IEEE Custom Integrated Circuits Conference - Santa Clara, CA, USA משך הזמן: 11 מאי 1998 → 14 מאי 1998 |
טביעת אצבע
להלן מוצגים תחומי המחקר של הפרסום 'Laser formed connections for programmable wiring'. יחד הם יוצרים טביעת אצבע ייחודית.פורמט ציטוט ביבליוגרפי
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