Frequency marker based on moiré deflectometry

O. Kafri; D. Meyerstein; Z. Karny

doi:10.1016/0143-8166(83)90006-4

Frequency marker based on moiré deflectometry

O. Kafri
, D. Meyerstein
, Z. Karny

פרסום מחקרי: פרסום בכתב עת › מאמר › ביקורת עמיתים

3 ציטוטים ‏(Scopus)

תקציר

We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

שפה מקורית	אנגלית
עמודים (מ-עד)	55-61
מספר עמודים	7
כתב עת	Optics and Lasers in Engineering
כרך	4
מספר גיליון	1
מזהי עצם דיגיטלי (DOIs)	https://doi.org/10.1016/0143-8166(83)90006-4
סטטוס פרסום	פורסם - 1983
פורסם באופן חיצוני	כן

גישה למסמך

10.1016/0143-8166(83)90006-4

קבצים וקישורים אחרים

Link to publication in Scopus

פורמט ציטוט ביבליוגרפי

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title = "Frequency marker based on moir{\'e} deflectometry",

abstract = "We propose a new method for frequency marking based on measuring the diffraction angle by moir{\'e} deflectometry. The method is demonstrated experimentally.",

author = "O. Kafri and D. Meyerstein and Z. Karny",

year = "1983",

doi = "10.1016/0143-8166(83)90006-4",

language = "אנגלית",

volume = "4",

pages = "55--61",

journal = "Optics and Lasers in Engineering",

issn = "0143-8166",

publisher = "Elsevier Ltd.",

number = "1",

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TY - JOUR

T1 - Frequency marker based on moiré deflectometry

AU - Kafri, O.

AU - Meyerstein, D.

AU - Karny, Z.

PY - 1983

Y1 - 1983

N2 - We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

AB - We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

UR - https://www.scopus.com/pages/publications/0020632752

U2 - 10.1016/0143-8166(83)90006-4

DO - 10.1016/0143-8166(83)90006-4

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AN - SCOPUS:0020632752

SN - 0143-8166

VL - 4

SP - 55

EP - 61

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

IS - 1

ER -

Frequency marker based on moiré deflectometry

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