TY - JOUR
T1 - Equilibria, stability, and transients in re-entrant lines under FBFS and LBFS dispatch and constant release
AU - Yan, Chao Bo
AU - Hassoun, Michael
AU - Meerkov, Semyon M.
PY - 2012
Y1 - 2012
N2 - A model of a re-entrant line, consisting of the bottleneck workcenter and time delays representing other workcenters, is considered. Its mathematical description is provided and performance metrics are introduced. The steady states of this model and their stability properties are investigated under two dispatch policies-first buffer first served (FBFS) and last buffer first served (LBFS)-and under constant release rate. The transients due to machine downtime are also analyzed. It is shown that, although LBFS may be viewed as having superior steady-state characteristics, it induces longer and more volatile transients than FBFS and, in some cases, periodic and chaotic regimes.
AB - A model of a re-entrant line, consisting of the bottleneck workcenter and time delays representing other workcenters, is considered. Its mathematical description is provided and performance metrics are introduced. The steady states of this model and their stability properties are investigated under two dispatch policies-first buffer first served (FBFS) and last buffer first served (LBFS)-and under constant release rate. The transients due to machine downtime are also analyzed. It is shown that, although LBFS may be viewed as having superior steady-state characteristics, it induces longer and more volatile transients than FBFS and, in some cases, periodic and chaotic regimes.
KW - Finite-time stability
KW - first buffer first served (FBFS) and last buffer first served (LBFS) dispatch
KW - nonlinear dynamics
KW - periodic and chaotic regimes
KW - re-entrant lines
KW - steady states
KW - throughput variability
KW - transients
UR - http://www.scopus.com/inward/record.url?scp=84860656760&partnerID=8YFLogxK
U2 - 10.1109/TSM.2012.2187969
DO - 10.1109/TSM.2012.2187969
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AN - SCOPUS:84860656760
SN - 0894-6507
VL - 25
SP - 211
EP - 229
JO - IEEE Transactions on Semiconductor Manufacturing
JF - IEEE Transactions on Semiconductor Manufacturing
IS - 2
M1 - 6172591
ER -