Electromigration simulation under DC/AC stresses considering microstructure

Keyphrases

• AC Current Density 100%
• AC Stress 100%
• AC-DC 100%
• DC Current Density 100%
• Electromigration 100%
• Failure Criterion 100%
• Finite Difference Simulation 100%
• Grain Boundary Orientation 100%
• Grain Size 100%
• Microstructural 100%
• Microstructure 100%
• Stress Evolution 100%
• Stress Level 100%

Engineering

• Alternating Current 100%
• Direct Current 100%
• Electromigration 100%
• Failure Criterion 100%
• Interconnects 100%
• Stress Level 100%

Material Science

• Density 100%
• Finite Difference Method 100%
• Grain Boundary 100%
• Grain Size 100%