Classification and cost estimation of WIP bubbles in a fab

Michael Hassoun; Gad Rabinowitz; Shlomi Lachs

doi:10.1109/issm.2005.1513368

Classification and cost estimation of WIP bubbles in a fab

Michael Hassoun
, Gad Rabinowitz
, Shlomi Lachs

פרסום מחקרי: פרסום בכתב עת › מאמר מכנס › ביקורת עמיתים

2 ציטוטים ‏(Scopus)

תקציר

The purpose of this article is to define and quantify the bubble phenomenon in a semiconductors fab. A "local bubble" is a relatively acute local and temporal WIP congestion. The local bubble is empirically identified and its impact on the local cycle time distribution is assessed. We then estimate its marginal impact on the overall line cycle time and cost. Finally, a novel visualization of the bubble progression is proposed.

שפה מקורית	אנגלית
מספר המאמר	MC191
עמודים (מ-עד)	323-326
מספר עמודים	4
כתב עת	IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
מזהי עצם דיגיטלי (DOIs)	https://doi.org/10.1109/issm.2005.1513368
סטטוס פרסום	פורסם - 2005
פורסם באופן חיצוני	כן
אירוע	IEEE International Symposium on Semiconductor Manufacturing, Conference Proceedings - San Jose, CA, ארצות הברית משך הזמן: 13 ספט׳ 2005 → 15 ספט׳ 2005

גישה למסמך

10.1109/issm.2005.1513368

קבצים וקישורים אחרים

Link to publication in Scopus

פורמט ציטוט ביבליוגרפי

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doi = "10.1109/issm.2005.1513368",

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journal = "IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings",

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AU - Rabinowitz, Gad

AU - Lachs, Shlomi

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AB - The purpose of this article is to define and quantify the bubble phenomenon in a semiconductors fab. A "local bubble" is a relatively acute local and temporal WIP congestion. The local bubble is empirically identified and its impact on the local cycle time distribution is assessed. We then estimate its marginal impact on the overall line cycle time and cost. Finally, a novel visualization of the bubble progression is proposed.

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SN - 1523-553X

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JO - IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

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T2 - IEEE International Symposium on Semiconductor Manufacturing, Conference Proceedings

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ER -

Classification and cost estimation of WIP bubbles in a fab

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