Validation of simulated integrated circuit reliability in conjunction with field data

Keyphrases

• Failure Rate 100%
• Integrated Circuit Reliability 100%
• Field Failures 66%
• Integrated Circuits 66%
• Strong Correlation 33%
• Prediction Method 33%
• Simulation Program 33%
• Reliability Prediction 33%
• Reliability Analysis 33%
• Technology Node 33%
• Physics of Failure Model 33%
• Competing Failure 33%
• Rate-based Simulation 33%
• Device Processing 33%
• Field Failure Data 33%
• Process Technology 33%
• Process Feature 33%

Engineering

• Failure Rate 100%
• Field Data 100%
• Integrated Circuit 100%
• Nodes 33%
• Simulation Program 33%
• Reliability Prediction 33%
• Failure Data 33%
• Reliability Analysis 33%
• Failure Model 33%
• Failure Approach 33%
• Feature Size 33%