Upgraded Full multiple reflections method improves accuracy in Time-Domain dielectric spectroscopy

Automated measurements of the dielectric properties of matter, based on Time-Domain Dielectric Spectrometry, have been used for several decades. In this paper, we report and evaluate a novel Full Multiple Reflections algorithm for extracting the material-under-test complex dielectric permittivity, able to perform over a wide range of frequencies. The novel method is based on the analysis of multiple reflections due to non-idealities and unintended impedance mismatches in the transmission line, to extract their influence on the final result. The method is compared against two classic strategies and proves to be more accurate, while overriding the well-known drawbacks of using non-ideal transmission lines. Limitations of the method are discussed and tested through representative results using materials widely studied and researched in the literature.