Supply signal fluctuations due to chip power grid resonance - A new reliability concern

M. Gurfinkel; P. Livshits; A. Rozen; Y. Fefer; J. B. Bernstein; Yoram Shapira

doi:10.1109/RELPHY.2008.4559006

Supply signal fluctuations due to chip power grid resonance - A new reliability concern

M. Gurfinkel, P. Livshits, A. Rozen, Y. Fefer, J. B. Bernstein, Yoram Shapira

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Original language	English
Title of host publication	46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS
Pages	721-722
Number of pages	2
DOIs	https://doi.org/10.1109/RELPHY.2008.4559006
State	Published - 2008
Externally published	Yes
Event	46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS - Phoenix, AZ, United States Duration: 27 Apr 2008 → 1 May 2008

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
ISSN (Print)	1541-7026

Conference

Conference	46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS
Country/Territory	United States
City	Phoenix, AZ
Period	27/04/08 → 1/05/08

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10.1109/RELPHY.2008.4559006

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Gurfinkel, M., Livshits, P., Rozen, A., Fefer, Y., Bernstein, J. B., & Shapira, Y. (2008). Supply signal fluctuations due to chip power grid resonance - A new reliability concern. In 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS (pp. 721-722). Article 4559006 (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/RELPHY.2008.4559006

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title = "Supply signal fluctuations due to chip power grid resonance - A new reliability concern",

author = "M. Gurfinkel and P. Livshits and A. Rozen and Y. Fefer and Bernstein, {J. B.} and Yoram Shapira",

year = "2008",

doi = "10.1109/RELPHY.2008.4559006",

language = "אנגלית",

isbn = "9781424420506",

series = "IEEE International Reliability Physics Symposium Proceedings",

pages = "721--722",

booktitle = "46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS",

note = "46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS ; Conference date: 27-04-2008 Through 01-05-2008",

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Gurfinkel, M, Livshits, P, Rozen, A, Fefer, Y, Bernstein, JB & Shapira, Y 2008, Supply signal fluctuations due to chip power grid resonance - A new reliability concern. in 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS., 4559006, IEEE International Reliability Physics Symposium Proceedings, pp. 721-722, 46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS, Phoenix, AZ, United States, 27/04/08. https://doi.org/10.1109/RELPHY.2008.4559006

Supply signal fluctuations due to chip power grid resonance - A new reliability concern. / Gurfinkel, M.; Livshits, P.; Rozen, A. et al.
46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. 2008. p. 721-722 4559006 (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Supply signal fluctuations due to chip power grid resonance - A new reliability concern

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