Strain compensated InGaAs/InGaP quantum well infrared detector for midwavelength band detection

S. Maimon, G. M. Cohen, E. Finkman, G. Bahir, D. Ritter, S. E. Schacham

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

A high detectivity multiquantum well midinfrared photodetector is reported. It is based on a strain compensated InGaAs/InGaP on InP structure, using bound-to-continuum intersubband absorption, with λP=4.9μm and ∼0.5 μm full width at half maximum. This design is unique by enabling a large critical thickness, thus increasing the quantum efficiency. Photodetectors with background-limited performance (BLIP) with detectivity of Dλ*(BLIP)=3.2×1010cm Hz /W up to 110 K, with only ten quantum well periods were implemented. Arguments are given to predict an optimized background-limited performance for this design up to 135 K.

Original languageEnglish
Pages (from-to)800-802
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number6
DOIs
StatePublished - 1998

Fingerprint

Dive into the research topics of 'Strain compensated InGaAs/InGaP quantum well infrared detector for midwavelength band detection'. Together they form a unique fingerprint.

Cite this