Skip to main navigation
Skip to search
Skip to main content
Ariel University Home
Help & FAQ
English
עברית
العربية
Home
Profiles
Research units
Research output
Prizes
Activities
Search by expertise, name or affiliation
SPC scheme to monitor linear predictors embedded in nonlinear profiles
Revital Danoch, Haim Shore
Department of Industrial Engineering and Management
Research output
:
Contribution to journal
›
Article
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'SPC scheme to monitor linear predictors embedded in nonlinear profiles'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Linear Predictor
100%
Nonlinear Profile
100%
Response Modeling Methodology
80%
Control Scheme
40%
Statistical Process Control
40%
Monotone
20%
Numerical Examples
20%
Per Se
20%
Linear Regression Analysis
20%
Hypothesis Testing
20%
Taylor Expansion
20%
Canonical Correlation Analysis
20%
Monte Carlo Simulation
20%
LP Residual
20%
Non-normal Errors
20%
Response Transformation
20%
Linear Regression Model
20%
Skewness
20%
Process Monitoring
20%
Response Distribution
20%
Mathematics
Linear Predictor
100%
Response Modeling
80%
Statistical Process Control
40%
Numerical Example
20%
Residuals
20%
Monte Carlo
20%
Taylor Series Expansion
20%
Statistical Hypothesis Testing
20%
Skewness
20%
Canonical Correlation Analysis
20%
Linear Regression Model
20%
Linear Regression Analysis
20%
Engineering
Control Scheme
100%
Statistical Process Control
100%
Numerical Example
50%
Taylor Series Expansion
50%
Linear Estimate
50%
Process Monitoring
50%
Computer Science
Linear Predictor
100%
Response Modeling
80%
Process Control
40%
Statistical Process
40%
Correlation Analysis
20%
Process Monitoring
20%
Taylor Series Expansion
20%
Monte Carlo Simulation
20%
Numerical Example
20%
Response Distribution
20%