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Spatial distributions of trapping centers in HfO2/SiO2 gate stack
Dawei Heh, Chadwin D. Young, George A. Brown, P. Y. Hung, Alain Diebold, Eric M. Vogel, Joseph B. Bernstein, Gennadi Bersuker
Research output: Contribution to journal › Article › peer-review
55
Scopus
citations