Spatial distributions of trapping centers in HfO 2/SiO 2 gate stacks
- Dawei Heh
- , Chadwin D. Young
- , George A. Brown
- , P. Y. Hung
- , Alain Diebold
- , Gennadi Bersuker
- , Eric M. Vogel
- , Joseph B. Bernstein
Research output: Contribution to journal › Article › peer-review
72
Scopus
citations