@inproceedings{ba0062afd89f4b3aa77cced0ccce7d2b,
title = "Software reliability estimation of microprocessor transient faults",
abstract = "The vulnerability of microprocessors to transient faults in radiation environments is of great concern for NASA space missions. Microprocessor transient faults can lead to anomalies of software execution and provoke system failures. This paper provides a complete approach to estimate the software reliability induced by transient faults in microprocessors.",
author = "B. Huang and M. Rodriguez and Bernstein, {J. B.} and Smidts, {C. S.}",
year = "2006",
doi = "10.2514/6.2006-5109",
language = "אנגלית",
isbn = "1563478188",
series = "Collection of Technical Papers - AIAA/ASME/SAE/ASEE 42nd Joint Propulsion Conference",
pages = "7591--7598",
booktitle = "Collection of Technical Papers - AIAA/ASME/SAE/ASEE 42nd Joint Propulsion Conference",
note = "AIAA/ASME/SAE/ASEE 42nd Joint Propulsion Conference ; Conference date: 09-07-2006 Through 12-07-2006",
}