TY - JOUR
T1 - SMT2020 - A Semiconductor Manufacturing Testbed
AU - Kopp, Denny
AU - Hassoun, Michael
AU - Kalir, Adar
AU - Monch, Lars
N1 - Publisher Copyright:
© 1988-2012 IEEE.
PY - 2020/11
Y1 - 2020/11
N2 - We present a new set of simulation models, organized in a testbed. The aim of the testbed consists in providing researchers with a platform able to credibly represent the complexity of modern semiconductor manufacturing. The testbed is open to public use, and include so far four models. A high-volume/low-mix model and a low-volume/high-mix model constitutes the foundation of the testbed. Two additional models incorporate the complexity of engineering lots. We conclude this paper by presenting a case study that demonstrates that the third and fourth model can be used to assess the performance of integrated dispatching strategies for production and engineering lots.
AB - We present a new set of simulation models, organized in a testbed. The aim of the testbed consists in providing researchers with a platform able to credibly represent the complexity of modern semiconductor manufacturing. The testbed is open to public use, and include so far four models. A high-volume/low-mix model and a low-volume/high-mix model constitutes the foundation of the testbed. Two additional models incorporate the complexity of engineering lots. We conclude this paper by presenting a case study that demonstrates that the third and fourth model can be used to assess the performance of integrated dispatching strategies for production and engineering lots.
KW - Discrete-event simulation
KW - production planning and control
KW - semiconductor manufacturing
KW - simulation experiments
KW - testbed
UR - http://www.scopus.com/inward/record.url?scp=85086742799&partnerID=8YFLogxK
U2 - 10.1109/TSM.2020.3001933
DO - 10.1109/TSM.2020.3001933
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AN - SCOPUS:85086742799
SN - 0894-6507
VL - 33
SP - 522
EP - 531
JO - IEEE Transactions on Semiconductor Manufacturing
JF - IEEE Transactions on Semiconductor Manufacturing
IS - 4
M1 - 9115710
ER -