Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film

Roman Pogreb, Roman Grynyov, Oz Ben-Yosef, Gene Whyman

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.

Original languageEnglish
Pages (from-to)661-667
Number of pages7
JournalInternational Journal of Polymer Analysis and Characterization
Volume26
Issue number8
DOIs
StatePublished - 2021

Keywords

  • Refraction index measurement
  • normal dispersion
  • surface plasmon resonance
  • thickness of thin films

Fingerprint

Dive into the research topics of 'Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film'. Together they form a unique fingerprint.

Cite this