Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film

Roman Pogreb; Roman Grynyov; Oz Ben-Yosef; Gene Whyman

doi:10.1080/1023666X.2021.1960703

Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film

Roman Pogreb, Roman Grynyov, Oz Ben-Yosef, Gene Whyman

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.

Original language	English
Pages (from-to)	661-667
Number of pages	7
Journal	International Journal of Polymer Analysis and Characterization
Volume	26
Issue number	8
DOIs	https://doi.org/10.1080/1023666X.2021.1960703
State	Published - 2021

Keywords

Refraction index measurement
normal dispersion
surface plasmon resonance
thickness of thin films

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10.1080/1023666X.2021.1960703

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title = "Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film",

abstract = "A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.",

keywords = "Refraction index measurement, normal dispersion, surface plasmon resonance, thickness of thin films",

author = "Roman Pogreb and Roman Grynyov and Oz Ben-Yosef and Gene Whyman",

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Pogreb, R, Grynyov, R, Ben-Yosef, O & Whyman, G 2021, 'Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film', International Journal of Polymer Analysis and Characterization, vol. 26, no. 8, pp. 661-667. https://doi.org/10.1080/1023666X.2021.1960703

Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film. / Pogreb, Roman; Grynyov, Roman; Ben-Yosef, Oz et al.
In: International Journal of Polymer Analysis and Characterization, Vol. 26, No. 8, 2021, p. 661-667.

Research output: Contribution to journal › Article › peer-review

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T1 - Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film

AU - Pogreb, Roman

AU - Grynyov, Roman

AU - Ben-Yosef, Oz

AU - Whyman, Gene

PY - 2021

Y1 - 2021

N2 - A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.

AB - A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.

KW - Refraction index measurement

KW - normal dispersion

KW - surface plasmon resonance

KW - thickness of thin films

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AN - SCOPUS:85112262221

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IS - 8

ER -

Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film

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