Simulating and improving microelectronic device reliability by scaling voltage and temperature

Keyphrases

• Device Reliability 100%
• Microelectronics 100%
• Derating 100%
• Stress Conditions 50%
• Voltage Frequency 50%
• Operating Parameters 50%
• Design Guidelines 50%
• System Developers 50%
• Power Dissipation 50%
• Switching Speed 50%
• Scaling Relations 50%
• Switching Energy 50%
• Practical Design 50%
• Device Operation 50%
• Internal Stress 50%
• Long-life Applications 50%
• Operation Parameters 50%
• Reduced Frequency 50%
• CMOS Ring Oscillator 50%
• Reduction Temperature 50%
• Single Device 50%
• Reduced Voltage 50%
• Dissipation Scales 50%

Engineering

• Simplifies 100%
• Microelectronics 100%
• Energy Dissipation 100%
• Stress Condition 100%
• Operating Parameter 100%
• Design Guideline 100%
• Switching Speed 100%
• Life Application 100%
• Single Device 100%
• Voltage Scaling 100%
• Internal Stress 100%
• Oscillator 100%