Self-heating Effects Measured in Fully Packaged FinFET Devices

Keyphrases

• Self-heating 100%
• Self-heating Effect 100%
• FinFET Devices 100%
• System Level 66%
• Device Level 66%
• Temperature Rise 33%
• Small Dimension 33%
• Induced Current 33%
• Frequency Effect 33%
• Increased Temperature 33%
• Measuring Techniques 33%
• Reliability Systems 33%
• Device Switching 33%
• Reliability Degradation 33%
• Degradation Level 33%
• Dynamic Power Dissipation 33%
• Thermal Offset 33%
• Unique Resources 33%
• Power Dissipation 33%

Engineering

• Heating Effect 100%
• Nodes 33%
• Energy Dissipation 33%
• Temperature Rise 33%
• Measuring Technique 33%
• Dynamic Power Dissipation 33%