Scanning near-field infrared microscopy based on tapered silver-halide probes

P. Ephrat; K. Roodenko; L. Nagli; A. Katzir

doi:10.1063/1.1644032

Scanning near-field infrared microscopy based on tapered silver-halide probes

P. Ephrat, K. Roodenko, L. Nagli, A. Katzir

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31 Scopus citations

Abstract

The development of scanning near-field infrared microscopes (SNIM) based on fiberoptic silver-halide probes was studied. The feasibility of using these probes in a SNIM system were demonstrated by imaging of a subwavelength test pattern. The knife-edge technique was used to perform spatial characterization of the radiation distribution emitted from these probes. These probes possess broad range of spectral transmission in the mid-infrared (IR) that proved very useful in high spatial resolution spectroscopy.

Original language	English
Pages (from-to)	637-639
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	4
DOIs	https://doi.org/10.1063/1.1644032
State	Published - 26 Jan 2004
Externally published	Yes

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10.1063/1.1644032

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abstract = "The development of scanning near-field infrared microscopes (SNIM) based on fiberoptic silver-halide probes was studied. The feasibility of using these probes in a SNIM system were demonstrated by imaging of a subwavelength test pattern. The knife-edge technique was used to perform spatial characterization of the radiation distribution emitted from these probes. These probes possess broad range of spectral transmission in the mid-infrared (IR) that proved very useful in high spatial resolution spectroscopy.",

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Scanning near-field infrared microscopy based on tapered silver-halide probes

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