Reliability prediction with MTOL

Keyphrases

• Activation Energy 100%
• Operational Life 100%
• Reliability Prediction 100%
• Operational Life Testing 100%
• Failure Time 100%
• Hot Carrier Injection 100%
• High Temperature 50%
• FPGA Device 50%
• Frequency Effect 50%
• Testing Method 50%
• Operating Voltage 50%
• Testing Procedures 50%
• Physics of Failure 50%
• Subzero 50%
• Qualification Process 50%
• Comprehensive Reliability 50%
• Operating Temperature 50%
• Time Prediction 50%
• 45 Nm CMOS Technology 50%
• Subzero Temperature 50%
• Activation Voltage 50%
• Voltage Acceleration 50%

Engineering

• Reliability Prediction 100%
• Operational Life 100%
• Activation Energy 66%
• Hot Carrier Injection 66%
• Operating Voltage 33%
• Acceleration Factor 33%
• Field Programmable Gate Arrays 33%
• Testing Method 33%
• Operating Temperature 33%
• Activation Voltage 33%