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Reliability Prediction from Burn-In Data Fit to Reliability Models
Joseph Bernstein
Department of Electrical and Electronics Engineering
Research output
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Book/Report
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Book
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peer-review
23
Scopus citations
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Keyphrases
Operating Conditions
100%
Reliability Model
100%
Reliability Prediction
100%
Burn-in
100%
System Designer
50%
System Reliability
50%
Semiconductor Manufacturing
50%
Life Test
50%
Manufacturing Firms
50%
Qualification Process
50%
Circuit Reliability
50%
Chip Temperature
50%
Chip-level
50%
Engineering
Reliability Prediction
100%
System Designer
50%
Illustrates
50%
System Reliability
50%
Semiconductor Manufacturing
50%
Manufacturing Company
50%