Prediction of earpiece field failure rate based on accelerated life tests

Avshalom Hava; Felix Barmoav; Eli Ribak; Carey Moulton; Bob Kowalski; Joseph B. Bernstein

doi:10.1109/EEEI.2012.6377091

Prediction of earpiece field failure rate based on accelerated life tests

Avshalom Hava, Felix Barmoav, Eli Ribak, Carey Moulton, Bob Kowalski, Joseph B. Bernstein

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We delineate an approach for predicting the audio components failure rate during field use, based on advanced accelerated life tests. The methodology provides a structural and well-organized process for focusing on the physics of failure of the part, selecting the proper stresses for acceleration and utilizing field data for final validation. We show a test case in which accuracy of more than 95% was achieved.

Original language	English
Title of host publication	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
DOIs	https://doi.org/10.1109/EEEI.2012.6377091
State	Published - 2012
Externally published	Yes
Event	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 - Eilat, Israel Duration: 14 Nov 2012 → 17 Nov 2012

Publication series

Name	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012

Conference

Conference	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
Country/Territory	Israel
City	Eilat
Period	14/11/12 → 17/11/12

Keywords

Failure Rate
Physics of Failure
Reliability
Weibull

Access to Document

10.1109/EEEI.2012.6377091

Cite this

Hava, A., Barmoav, F., Ribak, E., Moulton, C., Kowalski, B., & Bernstein, J. B. (2012). Prediction of earpiece field failure rate based on accelerated life tests. In 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 Article 6377091 (2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012). https://doi.org/10.1109/EEEI.2012.6377091

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abstract = "We delineate an approach for predicting the audio components failure rate during field use, based on advanced accelerated life tests. The methodology provides a structural and well-organized process for focusing on the physics of failure of the part, selecting the proper stresses for acceleration and utilizing field data for final validation. We show a test case in which accuracy of more than 95% was achieved.",

keywords = "Failure Rate, Physics of Failure, Reliability, Weibull",

author = "Avshalom Hava and Felix Barmoav and Eli Ribak and Carey Moulton and Bob Kowalski and Bernstein, {Joseph B.}",

year = "2012",

doi = "10.1109/EEEI.2012.6377091",

language = "אנגלית",

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note = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 ; Conference date: 14-11-2012 Through 17-11-2012",

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Hava, A, Barmoav, F, Ribak, E, Moulton, C, Kowalski, B & Bernstein, JB 2012, Prediction of earpiece field failure rate based on accelerated life tests. in 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012., 6377091, 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, Eilat, Israel, 14/11/12. https://doi.org/10.1109/EEEI.2012.6377091

Prediction of earpiece field failure rate based on accelerated life tests. / Hava, Avshalom; Barmoav, Felix; Ribak, Eli et al.
2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. 2012. 6377091 (2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Prediction of earpiece field failure rate based on accelerated life tests

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Keywords

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