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Power-Law Reliability Plotting for Microelectronics
Joseph B. Bernstein
Department of Electrical and Electronics Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
10
Scopus citations
Overview
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Dive into the research topics of 'Power-Law Reliability Plotting for Microelectronics'. Together they form a unique fingerprint.
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Keyphrases
Power Law
100%
Microelectronics
100%
Order of Magnitude
40%
Prediction Accuracy
20%
Time Change
20%
Linear Fit
20%
Reliability Prediction
20%
Time-based
20%
Reliability Analysis
20%
Testing Conditions
20%
Polynomial Degree
20%
Accelerated Testing
20%
Microelectronics Reliability
20%
Change Law
20%
Polynomial Curve Fitting
20%
Indicator Value
20%
Power Law Exponent
20%
Second-order Polynomial
20%
Engineering
Microelectronics
100%
Polynomial Order
50%
Accurate Prediction
50%
Reliability Prediction
50%
Reliability Analysis
50%
Testing Condition
50%
Measured Parameter
50%
Power Law Exponent
50%
Mathematics
Power Law
100%
Polynomial
16%
Accurate Prediction
16%
Order of a polynomial
16%