Photoconductivity of Ge/Si quantum dot photodetectors

N. Rappaport, E. Finkman, P. Boucaud, S. Sauvage, T. Brunhes, V. Le Thanh, D. Bouchier, S. E. Schacham

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Various structures of self-assembled Ge/Si quantum dot infrared photodetectors were implemented and investigated. The electronic structure of the QDIPs was studied by electrical and optical techniques including I-V characteristics, dark current, photoconductivity, photoluminescence, and photo-induced infrared absorption. The photoconductive spectra consist of a broad multi-peak, composed of peaks ranging from 70 to 220 meV. Their relative intensity changes with bias. Comparative dark current measurements were performed. Dark current limits the performance of this first generation of Ge/ Si QDIPs. It is plausible that direct doping in the dot layer is a viable way of reducing the dark current.

Original languageEnglish
Pages (from-to)513-516
Number of pages4
JournalInfrared Physics and Technology
Volume44
Issue number5-6
DOIs
StatePublished - 2003

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