Penetration depth measurement in high quality YBa2Cu3O7 - X thin films

E. Farber, G. Deutscher, J. P. Contour, E. Jerby

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Fingerprint

Dive into the research topics of 'Penetration depth measurement in high quality YBa2Cu3O7 - X thin films'. Together they form a unique fingerprint.

Keyphrases

Engineering

Physics