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Penetration depth measurement in high quality YBa
2
Cu
3
O
7 - X
thin films
E. Farber
, G. Deutscher
, J. P. Contour
, E. Jerby
Research output
:
Contribution to journal
›
Article
›
peer-review
23
Scopus citations
Overview
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Dive into the research topics of 'Penetration depth measurement in high quality YBa
2
Cu
3
O
7 - X
thin films'. Together they form a unique fingerprint.
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Keyphrases
Penetration Depth
100%
YBa2Cu3O7
100%
Depth Measurement
100%
Low Temperature
66%
Real Part
66%
Single Crystal
66%
Parallel-plate Resonator
33%
Non-monotonic Behavior
33%
Resonator Method
33%
Surface Resistance
33%
Linear Fitting
33%
Slope Value
33%
D-Wave
33%
Residual Loss
33%
Order Parameter Symmetry
33%
Earth and Planetary Sciences
Thin Films
100%
Single Crystal
100%
Depth Measurement
100%
Resonator
50%
Parallel Plate
50%
Physics
Thin Films
100%
Single Crystal
100%
Conductance
100%
Resonator
50%
Parallel Plate
50%
Material Science
Thin Films
100%
Single Crystal
100%
Resonator
50%
Chemistry
Single Crystalline Solid
100%
Order Parameter
50%
Surface Resistance
50%