Penetration depth measurement in high quality YBa2Cu3O7 - X thin films

E. Farber, G. Deutscher, J. P. Contour, E. Jerby

Research output: Contribution to journalArticlepeer-review

21 Scopus citations


The parallel plate resonator method has been used for measuring high quality YBa2Cu3O7 - x (YBCO) thin films, which have low temperature residual losses comparable to those previously obtained in single crystals. The surface resistance and the real part of the conductivity show a non-monotonic behaviour with a broad peak around 45 K. The penetration depth and the real part of the conductivity vary linearly at low temperatures. The lowest penetration depth linear fitting has a slope value of 2.2 Å/K to 2.5 Å/K up to 20 K which is lower than previous measurements on YBCO single crystals. An interpretation of this smaller slope in terms of the generally accepted d-wave order parameter symmetry presents difficulties.

Original languageEnglish
Pages (from-to)159-162
Number of pages4
JournalEuropean Physical Journal B
Issue number2
StatePublished - 1998
Externally publishedYes


  • 74.25.Nf Response to electromagnetic fields (nuclear magnetic resonance, surface impedance, etc.)
  • 74.72.Bk Y-based cuprates
  • 74.76.Bz High-Tc films


Dive into the research topics of 'Penetration depth measurement in high quality YBa2Cu3O7 - X thin films'. Together they form a unique fingerprint.

Cite this