TY - JOUR
T1 - On universality of scaling law describing roughness of triple line
AU - Bormashenko, Edward
AU - Musin, Albina
AU - Whyman, Gene
AU - Barkay, Zahava
AU - Zinigrad, Michael
N1 - Publisher Copyright:
© 2015, EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg.
PY - 2015
Y1 - 2015
N2 - Abstract.: The fine structure of the three-phase (triple) line was studied for different liquids, various topographies of micro-rough substrates and various wetting regimes. Wetting of porous and pillar-based micro-scaled polymer surfaces was investigated. The triple line was visualized with the environmental scanning electron microscope and scanning electron microscope for the “frozen” triple lines. The value of the roughness exponent for water (ice)/rough polymer systems was located within 0.55-0.63. For epoxy glue/rough polymer systems somewhat lower values of the exponent, $ 0.42 < \zeta < 0.54$, were established. The obtained values of were close for the Cassie and Wenzel wetting regimes, different liquids, and different substrates’ topographies. Thus, the above values of the exponent are to a great extent universal. The switch of the exponent, when the roughness size approaches to the correlation length of the defects, is also universal. Graphical abstract: [Figure not available: see fulltext.].
AB - Abstract.: The fine structure of the three-phase (triple) line was studied for different liquids, various topographies of micro-rough substrates and various wetting regimes. Wetting of porous and pillar-based micro-scaled polymer surfaces was investigated. The triple line was visualized with the environmental scanning electron microscope and scanning electron microscope for the “frozen” triple lines. The value of the roughness exponent for water (ice)/rough polymer systems was located within 0.55-0.63. For epoxy glue/rough polymer systems somewhat lower values of the exponent, $ 0.42 < \zeta < 0.54$, were established. The obtained values of were close for the Cassie and Wenzel wetting regimes, different liquids, and different substrates’ topographies. Thus, the above values of the exponent are to a great extent universal. The switch of the exponent, when the roughness size approaches to the correlation length of the defects, is also universal. Graphical abstract: [Figure not available: see fulltext.].
KW - Soft Matter: Polymers and Polyelectrolytes
UR - http://www.scopus.com/inward/record.url?scp=84961382308&partnerID=8YFLogxK
U2 - 10.1140/epje/i2015-15002-y
DO - 10.1140/epje/i2015-15002-y
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AN - SCOPUS:84961382308
SN - 1292-8941
VL - 38
JO - European Physical Journal E
JF - European Physical Journal E
IS - 1
M1 - 2
ER -