On the role of contact line tension and 2D defects in the formation of the water depletion layer on hydrophobic surfaces

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Abstract

It is demonstrated that formation of nano-voids in the depletion liquid layer on the hydrophobic surfaces may be due to the phenomenon of the contact line tension. The mean radius of 2D circular void is calculated. It coincides with characteristic dimensions of nano-voids in depletion liquid layers on the hydrophobic surfaces reported experimentally.

Original languageEnglish
Pages (from-to)186-188
Number of pages3
JournalChemical Physics Letters
Volume456
Issue number4-6
DOIs
StatePublished - 5 May 2008

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