New technique to extract TDDB acceleration parameters from fast Qbd tests

Yuan Chen; John S. Suehle; Bruce Shen; Joseph Bernstein; Cleston Messick; Prasad Chaparala

New technique to extract TDDB acceleration parameters from fast Q_bd tests

Yuan Chen, John S. Suehle, Bruce Shen, Joseph Bernstein, Cleston Messick, Prasad Chaparala

Research output: Contribution to conference › Paper › peer-review

Abstract

A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

Original language	English
Pages	67-69
Number of pages	3
State	Published - 1997
Externally published	Yes
Event	Proceedings of the 1997 IEEE International Integrated Reliability Workshop - Tahoe, CA, USA Duration: 13 Oct 1997 → 16 Oct 1997

Conference

Conference	Proceedings of the 1997 IEEE International Integrated Reliability Workshop
City	Tahoe, CA, USA
Period	13/10/97 → 16/10/97

Cite this

@conference{d7af6cab6ca04819871af5e7a16ef324,

title = "New technique to extract TDDB acceleration parameters from fast Qbd tests",

abstract = "A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.",

author = "Yuan Chen and Suehle, {John S.} and Bruce Shen and Joseph Bernstein and Cleston Messick and Prasad Chaparala",

year = "1997",

language = "אנגלית",

pages = "67--69",

note = "Proceedings of the 1997 IEEE International Integrated Reliability Workshop ; Conference date: 13-10-1997 Through 16-10-1997",

}

TY - CONF

T1 - New technique to extract TDDB acceleration parameters from fast Qbd tests

AU - Chen, Yuan

AU - Suehle, John S.

AU - Shen, Bruce

AU - Bernstein, Joseph

AU - Messick, Cleston

AU - Chaparala, Prasad

PY - 1997

Y1 - 1997

N2 - A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

AB - A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

UR - http://www.scopus.com/inward/record.url?scp=0031370126&partnerID=8YFLogxK

M3 - ???researchoutput.researchoutputtypes.contributiontoconference.paper???

AN - SCOPUS:0031370126

SP - 67

EP - 69

T2 - Proceedings of the 1997 IEEE International Integrated Reliability Workshop

Y2 - 13 October 1997 through 16 October 1997

ER -

New technique to extract TDDB acceleration parameters from fast Q_bd tests

Abstract

Conference

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