Abstract
A modified method to improve thin film vacuum sputtering is presented. This method is capable of controlling the sputtering plasma via an external set of magnets, in a similar fashion to the tetrode sputtering method. The main advantage of Magnetic Controlled Plasma Sputtering (MCPS) is its ability to independently control all deposition parameters without any interference or cross-talk. Deposition rate, using the MCPS, is found to be almost twice the rate of triode and tetrode sputtering techniques. Experimental results using the MCPS to deposit Ni layers are described.
| Original language | English |
|---|---|
| Pages (from-to) | 1081-1083 |
| Number of pages | 3 |
| Journal | Vacuum |
| Volume | 47 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 1996 |
| Externally published | Yes |