Microwave measurements of high Tc superconductors

E. Farber; G. Deutscher; G. Koren; E. Jerby

doi:10.1109/EEIS.1996.567011

Microwave measurements of high Tc superconductors

E. Farber, G. Deutscher, G. Koren, E. Jerby

Research output: Contribution to conference › Paper › peer-review

Abstract

The parallel plate resonator has been used for measuring high-Tc superconductors. This method is used to measure superconducting c-axis oriented YBa₂Cu₃O_7-δ approx.1cm² thin films. These approx. 1cm² films were grown by two methods: pulsed laser deposition and dc sputtering. Using this method a high resolution surface resistance is calculated directly from the measured unloaded quality factor. The method provides relatively accurate and sensitive measurements of the penetration depth. The change in the penetration depth at the low temperature range reflects the superconducting microscopic state. The parallel-plate resonator method has a resolution of a few angstrom in the penetration depth measurements.

Original language	English
Pages	444-447
Number of pages	4
DOIs	https://doi.org/10.1109/EEIS.1996.567011
State	Published - 1996
Externally published	Yes
Event	Proceedings of the 1996 19th Convention of Electrical and Electronics Engineers in Israel - Jerusalem, Isr Duration: 5 Nov 1996 → 6 Nov 1996

Conference

Conference	Proceedings of the 1996 19th Convention of Electrical and Electronics Engineers in Israel
City	Jerusalem, Isr
Period	5/11/96 → 6/11/96

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10.1109/EEIS.1996.567011

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abstract = "The parallel plate resonator has been used for measuring high-Tc superconductors. This method is used to measure superconducting c-axis oriented YBa2Cu3O7-δ approx.1cm2 thin films. These approx. 1cm2 films were grown by two methods: pulsed laser deposition and dc sputtering. Using this method a high resolution surface resistance is calculated directly from the measured unloaded quality factor. The method provides relatively accurate and sensitive measurements of the penetration depth. The change in the penetration depth at the low temperature range reflects the superconducting microscopic state. The parallel-plate resonator method has a resolution of a few angstrom in the penetration depth measurements.",

author = "E. Farber and G. Deutscher and G. Koren and E. Jerby",

year = "1996",

doi = "10.1109/EEIS.1996.567011",

language = "אנגלית",

pages = "444--447",

note = "Proceedings of the 1996 19th Convention of Electrical and Electronics Engineers in Israel ; Conference date: 05-11-1996 Through 06-11-1996",

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AU - Farber, E.

AU - Deutscher, G.

AU - Koren, G.

AU - Jerby, E.

PY - 1996

Y1 - 1996

N2 - The parallel plate resonator has been used for measuring high-Tc superconductors. This method is used to measure superconducting c-axis oriented YBa2Cu3O7-δ approx.1cm2 thin films. These approx. 1cm2 films were grown by two methods: pulsed laser deposition and dc sputtering. Using this method a high resolution surface resistance is calculated directly from the measured unloaded quality factor. The method provides relatively accurate and sensitive measurements of the penetration depth. The change in the penetration depth at the low temperature range reflects the superconducting microscopic state. The parallel-plate resonator method has a resolution of a few angstrom in the penetration depth measurements.

AB - The parallel plate resonator has been used for measuring high-Tc superconductors. This method is used to measure superconducting c-axis oriented YBa2Cu3O7-δ approx.1cm2 thin films. These approx. 1cm2 films were grown by two methods: pulsed laser deposition and dc sputtering. Using this method a high resolution surface resistance is calculated directly from the measured unloaded quality factor. The method provides relatively accurate and sensitive measurements of the penetration depth. The change in the penetration depth at the low temperature range reflects the superconducting microscopic state. The parallel-plate resonator method has a resolution of a few angstrom in the penetration depth measurements.

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T2 - Proceedings of the 1996 19th Convention of Electrical and Electronics Engineers in Israel

Y2 - 5 November 1996 through 6 November 1996

ER -

Microwave measurements of high Tc superconductors

Abstract

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