Mechanism for reduced NBTI effect under pulsed bias stress conditions

B. Zhu; J. S. Suehle; J. B. Bernstein

doi:10.1109/RELPHY.2004.1315453

Mechanism for reduced NBTI effect under pulsed bias stress conditions

B. Zhu
, J. S. Suehle
, J. B. Bernstein

Research output: Contribution to journal › Conference article › peer-review

5 Scopus citations

Abstract

A series of experiments are conducted to study the physical mechanism of reduced NBTI effects observed under pulsed bias conditions. A reduction of V_th and I_on is observed for pulse periods shorter than critical time constants that are believed to be associated with hole trapping and detrapping processes. A two time constant model is developed to explain the reduction of V_th and I_on as a function of pulse repetition frequency.

Original language	English
Article number	1315453
Pages (from-to)	689-690
Number of pages	2
Journal	IEEE International Reliability Physics Symposium Proceedings
Volume	2004-January
Issue number	January
DOIs	https://doi.org/10.1109/RELPHY.2004.1315453
State	Published - 2004
Externally published	Yes
Event	42nd Annual IEEE International Reliability Physics Symposium, IRPS 2004 - Phoenix, United States Duration: 25 Apr 2004 → 29 Apr 2004

Access to Document

10.1109/RELPHY.2004.1315453

Cite this

@article{29c59ecc4a604a77b438136d8a53952b,

title = "Mechanism for reduced NBTI effect under pulsed bias stress conditions",

abstract = "A series of experiments are conducted to study the physical mechanism of reduced NBTI effects observed under pulsed bias conditions. A reduction of Vth and Ion is observed for pulse periods shorter than critical time constants that are believed to be associated with hole trapping and detrapping processes. A two time constant model is developed to explain the reduction of Vth and Ion as a function of pulse repetition frequency.",

author = "B. Zhu and Suehle, \{J. S.\} and Bernstein, \{J. B.\}",

note = "Publisher Copyright: {\textcopyright} 2004 IEEE.; 42nd Annual IEEE International Reliability Physics Symposium, IRPS 2004 ; Conference date: 25-04-2004 Through 29-04-2004",

year = "2004",

doi = "10.1109/RELPHY.2004.1315453",

language = "אנגלית",

volume = "2004-January",

pages = "689--690",

journal = "IEEE International Reliability Physics Symposium Proceedings",

issn = "1541-7026",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "January",

}

TY - JOUR

T1 - Mechanism for reduced NBTI effect under pulsed bias stress conditions

AU - Zhu, B.

AU - Suehle, J. S.

AU - Bernstein, J. B.

PY - 2004

Y1 - 2004

N2 - A series of experiments are conducted to study the physical mechanism of reduced NBTI effects observed under pulsed bias conditions. A reduction of Vth and Ion is observed for pulse periods shorter than critical time constants that are believed to be associated with hole trapping and detrapping processes. A two time constant model is developed to explain the reduction of Vth and Ion as a function of pulse repetition frequency.

AB - A series of experiments are conducted to study the physical mechanism of reduced NBTI effects observed under pulsed bias conditions. A reduction of Vth and Ion is observed for pulse periods shorter than critical time constants that are believed to be associated with hole trapping and detrapping processes. A two time constant model is developed to explain the reduction of Vth and Ion as a function of pulse repetition frequency.

UR - https://www.scopus.com/pages/publications/84932111615

U2 - 10.1109/RELPHY.2004.1315453

DO - 10.1109/RELPHY.2004.1315453

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???

AN - SCOPUS:84932111615

SN - 1541-7026

VL - 2004-January

SP - 689

EP - 690

JO - IEEE International Reliability Physics Symposium Proceedings

JF - IEEE International Reliability Physics Symposium Proceedings

IS - January

M1 - 1315453

T2 - 42nd Annual IEEE International Reliability Physics Symposium, IRPS 2004

Y2 - 25 April 2004 through 29 April 2004

ER -

Mechanism for reduced NBTI effect under pulsed bias stress conditions

Abstract

Access to Document

Other files and links

Fingerprint

Cite this