TY - JOUR
T1 - Mechanism for reduced NBTI effect under pulsed bias stress conditions
AU - Zhu, B.
AU - Suehle, J. S.
AU - Bernstein, J. B.
N1 - Publisher Copyright:
© 2004 IEEE.
PY - 2004
Y1 - 2004
N2 - A series of experiments are conducted to study the physical mechanism of reduced NBTI effects observed under pulsed bias conditions. A reduction of Vth and Ion is observed for pulse periods shorter than critical time constants that are believed to be associated with hole trapping and detrapping processes. A two time constant model is developed to explain the reduction of Vth and Ion as a function of pulse repetition frequency.
AB - A series of experiments are conducted to study the physical mechanism of reduced NBTI effects observed under pulsed bias conditions. A reduction of Vth and Ion is observed for pulse periods shorter than critical time constants that are believed to be associated with hole trapping and detrapping processes. A two time constant model is developed to explain the reduction of Vth and Ion as a function of pulse repetition frequency.
UR - http://www.scopus.com/inward/record.url?scp=84932111615&partnerID=8YFLogxK
M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???
AN - SCOPUS:84932111615
SN - 1541-7026
SP - 689
EP - 690
JO - IEEE International Reliability Physics Symposium Proceedings
JF - IEEE International Reliability Physics Symposium Proceedings
T2 - 42nd Annual IEEE International Reliability Physics Symposium, IRPS 2004
Y2 - 25 April 2004 through 29 April 2004
ER -