Measurement of electron capture probability in quantum well

S. Maimon, E. Finkman, S. E. Schacham, D. Ritter, G. Bahir

Research output: Contribution to journalArticlepeer-review


A new method for measuring the capture probability of excited electrons into quantum wells is presented. Unlike previous techniques, this method is direct, and enables the determination of capture probability as a function of injected electron energy above the well. It is based on an HBT-like structure, with a quantum well as a base. The capture probability is the ratio between base and emitter currents. Two types of bases were studied, a highly p-doped and a low n-doped. The capture by the p+ well is much larger than by the n well, probably since the dominant capture mechanism is by electron-hole and electron-hole-plasmon in the former, while in the n doped well the capture is due to a polar optical phonon interaction.

Original languageEnglish
Pages (from-to)228-231
Number of pages4
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Issue number1-4
StatePublished - 15 Jul 1998


  • Capture probability
  • QWIP
  • Quantum well


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