TY - GEN
T1 - Learning parametric-output hmms with two aliased states
AU - Weiss, Roi
AU - Nadler, Boaz
PY - 2015
Y1 - 2015
N2 - In various applications involving hidden Markov models (HMMs), some of the hidden states are aliased, having identical output distributions. The minimality, identifiability and learnability of such aliased HMMs have been long standing problems, with only partial solutions provided thus far. In this paper we focus on parametric-output HMMs, whose output distributions come from a parametric family, and that have exactly two aliased states. For this class, we present a complete characterization of their minimality and identifiability. Furthermore, for a large family of parametric output distributions, we derive computationally efficient and statistically consistent algorithms to detect the presence of aliasing and learn the aliased HMM transition and emission parameters. We illustrate our theoretical analysis by several simulations.
AB - In various applications involving hidden Markov models (HMMs), some of the hidden states are aliased, having identical output distributions. The minimality, identifiability and learnability of such aliased HMMs have been long standing problems, with only partial solutions provided thus far. In this paper we focus on parametric-output HMMs, whose output distributions come from a parametric family, and that have exactly two aliased states. For this class, we present a complete characterization of their minimality and identifiability. Furthermore, for a large family of parametric output distributions, we derive computationally efficient and statistically consistent algorithms to detect the presence of aliasing and learn the aliased HMM transition and emission parameters. We illustrate our theoretical analysis by several simulations.
UR - http://www.scopus.com/inward/record.url?scp=84969557077&partnerID=8YFLogxK
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AN - SCOPUS:84969557077
T3 - 32nd International Conference on Machine Learning, ICML 2015
SP - 635
EP - 644
BT - 32nd International Conference on Machine Learning, ICML 2015
A2 - Bach, Francis
A2 - Blei, David
T2 - 32nd International Conference on Machine Learning, ICML 2015
Y2 - 6 July 2015 through 11 July 2015
ER -