Latent reliability degradation of ultra-thin oxides after heavy ion and γ-ray irradiation

Bin Wang, J. S. Suehle, E. M. Vogel, J. R. Conley, C. E. Weintraub, A. H. Johnston, J. B. Bernstein

Research output: Contribution to conferencePaperpeer-review

7 Scopus citations

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Engineering