Latent reliability degradation of ultra-thin oxides after heavy ion and γ-ray irradiation
- Bin Wang
- , J. S. Suehle
- , E. M. Vogel
- , J. R. Conley
- , C. E. Weintraub
- , A. H. Johnston
- , J. B. Bernstein
Research output: Contribution to conference › Paper › peer-review
7
Scopus
citations