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Interface properties of various passivations of HgCdTe
S. E. Schacham
, E. Finkman
Research output
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Contribution to journal
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Conference article
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peer-review
Overview
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Dive into the research topics of 'Interface properties of various passivations of HgCdTe'. Together they form a unique fingerprint.
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Keyphrases
Anodic
100%
HgCdTe
100%
Passivation
100%
Sulfide
100%
Interface Properties
100%
N-type
100%
Low Temperature
50%
Temperature Rise
50%
Charge Density
50%
Skin Layer
50%
Diode
50%
Trapping Mechanisms
50%
ZnS Coating
50%
Etched Surface
50%
Device Technology
50%
High Electron Mobility
50%
Film Coating
50%
Flat Band
50%
Hg1-xCdxTe
50%
Surface Passivation
50%
Sulfide Films
50%
Inversion Layer
50%
Decreasing Temperature
50%
Space Charge Region
50%
Anodic Oxide
50%
Surface Recombination Velocity
50%
Bulk Properties
50%
2D Electron Gas (2DEG)
50%
Photoelectromagnetic Effect
50%
Surface Form
50%
Material Science
Interface Property
100%
Sulfide
100%
Thioether
100%
Density
33%
Film
33%
Oxide Compound
33%
Surface Passivation
33%
Electron Mobility
33%