Identification and cost estimation of WIP bubbles in a fab

Michael Hassoun; Gad Rabinowitz; Shlomi Lachs

doi:10.1109/TSM.2008.2000264

Identification and cost estimation of WIP bubbles in a fab

Michael Hassoun, Gad Rabinowitz, Shlomi Lachs

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

We quantify the impact of work in process (WIP) bubbles on a semiconductor fab. As a preliminary step, we formalize the concept of WIP bubbles by decomposing them into local events of relatively acute and temporary WIP congestion. The local bubble is empirically identified and its impact on local waiting time distribution is assessed. We then estimate its marginal impact on the overall line waiting time and cost. Finally, a novel visualization tool for the bubble's progression is proposed.

Original language	English
Article number	4512065
Pages (from-to)	217-222
Number of pages	6
Journal	IEEE Transactions on Semiconductor Manufacturing
Volume	21
Issue number	2
DOIs	https://doi.org/10.1109/TSM.2008.2000264
State	Published - May 2008
Externally published	Yes

Keywords

Congestion
Production management
Semiconductors
Work-in-process

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10.1109/TSM.2008.2000264

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Identification and cost estimation of WIP bubbles in a fab

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Keywords

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