Hunting down the bubble makers in fabs

M. Hassoun; G. Rabinowitz

doi:10.1109/TSM.2009.2039244

Hunting down the bubble makers in fabs

M. Hassoun, G. Rabinowitz

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Based on a simulated Non Volatile Memory fab, we employ data-mining to identify and quantify the apparent causes of work in process bubbles along the process. The chosen bubble formalization methods proved able to detect the phenomenon and enabled its occurrence frequency to be forecasted. In the chosen environment, bubbles seem to be highly correlated with the utilization patterns of the process segment considered.

Original language	English
Article number	5357373
Pages (from-to)	13-20
Number of pages	8
Journal	IEEE Transactions on Semiconductor Manufacturing
Volume	23
Issue number	1
DOIs	https://doi.org/10.1109/TSM.2009.2039244
State	Published - Feb 2010
Externally published	Yes

Keywords

Congestion
Production management
Semiconductors
Work-in-process

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10.1109/TSM.2009.2039244

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abstract = "Based on a simulated Non Volatile Memory fab, we employ data-mining to identify and quantify the apparent causes of work in process bubbles along the process. The chosen bubble formalization methods proved able to detect the phenomenon and enabled its occurrence frequency to be forecasted. In the chosen environment, bubbles seem to be highly correlated with the utilization patterns of the process segment considered.",

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author = "M. Hassoun and G. Rabinowitz",

note = "Funding Information: Manuscript received November 18, 2008; revised August 14, 2009; accepted November 20, 2009. First published December 22, 2009; current version published February 03, 2010. This work was supported in part by the Intel Corporation. The authors are with the Industrial Engineering and Management Department, Ben Gurion University of the Negrev, Beer Sheva 84105, Israel. Digital Object Identifier 10.1109/TSM.2009.2039244",

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Hunting down the bubble makers in fabs

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Keywords

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