High-temperature time domain measurement system for solid and molten materials

G. Orr, P. Ben Ishai, M. Roth

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A low-cost time domain system for measuring dielectric relaxation in the frequency range of 1 Hz-1 MHz of solid and molten materials at high temperatures is described in detail. A parallel plate electrode sample cell is described that can hold molten material by capillary action. In order to avoid electrical breakdown or a change in electrode distance due to opposite charge buildup, the step voltage can be set to the mV range. At this level interference noise affects the measurements and active filtering is required. The resulting signal is captured using a digital storage oscilloscope. An algorithm for reducing the measured data prior to data processing is discussed. The system is calibration free and its upper temperature is limited only by the construction materials of the furnace and electrodes. Molten NaCl is presented as a test sample.

Original languageEnglish
Article number105502
JournalMeasurement Science and Technology
Volume29
Issue number10
DOIs
StatePublished - 4 Sep 2018

Keywords

  • NaCl
  • TDS
  • conductivity
  • dielectric spectroscopy
  • furnace
  • high temperature
  • spectroscopy

Fingerprint

Dive into the research topics of 'High-temperature time domain measurement system for solid and molten materials'. Together they form a unique fingerprint.

Cite this