Frequency marker based on moiré deflectometry

O. Kafri; D. Meyerstein; Z. Karny

doi:10.1016/0143-8166(83)90006-4

Frequency marker based on moiré deflectometry

O. Kafri, D. Meyerstein, Z. Karny

Research output: Contribution to journal › Article › peer-review

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Abstract

We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

Original language	English
Pages (from-to)	55-61
Number of pages	7
Journal	Optics and Lasers in Engineering
Volume	4
Issue number	1
DOIs	https://doi.org/10.1016/0143-8166(83)90006-4
State	Published - 1983
Externally published	Yes

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title = "Frequency marker based on moir{\'e} deflectometry",

abstract = "We propose a new method for frequency marking based on measuring the diffraction angle by moir{\'e} deflectometry. The method is demonstrated experimentally.",

author = "O. Kafri and D. Meyerstein and Z. Karny",

year = "1983",

doi = "10.1016/0143-8166(83)90006-4",

language = "אנגלית",

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AU - Meyerstein, D.

AU - Karny, Z.

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AB - We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

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SN - 0143-8166

VL - 4

SP - 55

EP - 61

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

IS - 1

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Frequency marker based on moiré deflectometry

Abstract

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