Finite size and temperature corrections to the integer quantum Hall effect

In this paper we suggest a mechanism, which may be responsible for the effect first presented by Yoshihiro et al., i.e., the linear relation between the deviation of the Hall resistance from the ideal plateau and the longitudinal resistance Δρ_xy≡-sρ_xx^min. This mechanism is based on a variable range hopping current that flows through the bulk. The presented model predicts that s≅d/w_p where d is the length of the Hall probes and w_p is its width. This result agrees with most of the experiments, and suggests an explanation for the device dependent but cool-down independent nature of the coefficient s.