Femtometer-resolved wavelength monitor based on photodiode optoelectronic chromatic dispersion with RF phase-shift amplification

Egor Liokumovitch; Ziv Glasser; Shmuel Sternklar

doi:10.1364/OL.462018

Femtometer-resolved wavelength monitor based on photodiode optoelectronic chromatic dispersion with RF phase-shift amplification

Egor Liokumovitch
, Ziv Glasser
, Shmuel Sternklar

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G = 4 · 10⁴, a peak phase-shift sensitivity of ∆θ = 27 deg/pm is achieved, corresponding to a spectral resolution of ∆λ_res = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.

Original language	English
Pages (from-to)	2622-2625
Number of pages	4
Journal	Optics Letters
Volume	47
Issue number	11
DOIs	https://doi.org/10.1364/OL.462018
State	Published - 1 Jun 2022

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abstract = "The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G = 4 · 104, a peak phase-shift sensitivity of ∆θ = 27 deg/pm is achieved, corresponding to a spectral resolution of ∆λres = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.",

author = "Egor Liokumovitch and Ziv Glasser and Shmuel Sternklar",

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AU - Liokumovitch, Egor

AU - Glasser, Ziv

AU - Sternklar, Shmuel

PY - 2022/6/1

Y1 - 2022/6/1

N2 - The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G = 4 · 104, a peak phase-shift sensitivity of ∆θ = 27 deg/pm is achieved, corresponding to a spectral resolution of ∆λres = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.

AB - The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G = 4 · 104, a peak phase-shift sensitivity of ∆θ = 27 deg/pm is achieved, corresponding to a spectral resolution of ∆λres = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.

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JF - Optics Letters

IS - 11

ER -

Femtometer-resolved wavelength monitor based on photodiode optoelectronic chromatic dispersion with RF phase-shift amplification

Abstract

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