Skip to main navigation
Skip to search
Skip to main content
Ariel University Home
Help & FAQ
Link opens in a new tab
English
עברית
العربية
Search content at Ariel University
Home
Profiles
Research units
Equipment
Research output
Prizes
Activities
Press/Media
Failure rate estimation of known failure mechanisms of electronic packages
Liyu Yang
,
Joseph B. Bernstein
Research output
:
Contribution to journal
›
Article
›
peer-review
15
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Failure rate estimation of known failure mechanisms of electronic packages'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Failure Mechanism
100%
Failure Rate
100%
Electronic Packaging
100%
Failure Rate Prediction
100%
Confidence Bounds
100%
Statistical Features
50%
Failure number
50%
Electronic Components
50%
Stress Testing
50%
Chi-square Statistic
50%
Acceleration Factor
50%
Failure Phenomena
50%
Failure Data
50%
Constant Failure Rate
50%
Rate-based
50%
Solder Joint
50%
Expected number of Failures
50%
Accelerated Testing
50%
Product Reliability
50%
Product Launch
50%
Failure Rate Modeling
50%
Engineering
Failure Rate
100%
Failure Mechanism
100%
Application Field
50%
Joints (Structural Components)
25%
Acceleration Factor
25%
Failure Data
25%
Constant Failure Rate
25%
Product Reliability
25%
Product Launch
25%
Statistical Characteristic
25%
Case Study
25%
Computer Science
Confidence Bound
100%
Observed Failure
100%
Case Study
50%
Successful Product
50%
Constant Failure Rate
50%