Electronic circuit reliability modeling

Joseph B. Bernstein; Moshe Gurfinkel; Xiaojun Li; Jörg Walters; Yoram Shapira; Michael Talmor

doi:10.1016/j.microrel.2005.12.004

Electronic circuit reliability modeling

Joseph B. Bernstein
, Moshe Gurfinkel
, Xiaojun Li
, Jörg Walters
, Yoram Shapira
, Michael Talmor

Research output: Contribution to journal › Article › peer-review

154 Scopus citations

Abstract

The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

Original language	English
Pages (from-to)	1957-1979
Number of pages	23
Journal	Microelectronics Reliability
Volume	46
Issue number	12
DOIs	https://doi.org/10.1016/j.microrel.2005.12.004
State	Published - Dec 2006
Externally published	Yes

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10.1016/j.microrel.2005.12.004

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title = "Electronic circuit reliability modeling",

abstract = "The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.",

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year = "2006",

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AU - Bernstein, Joseph B.

AU - Gurfinkel, Moshe

AU - Li, Xiaojun

AU - Walters, Jörg

AU - Shapira, Yoram

AU - Talmor, Michael

PY - 2006/12

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AB - The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

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AN - SCOPUS:33748937377

SN - 0026-2714

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JO - Microelectronics Reliability

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Electronic circuit reliability modeling

Abstract

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